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《科学前沿报告会》 第386期

科学前沿报告会(386)

报告题目

Ultrafast Spectroscopy Characterization toward Next Generation High Performance Electronic and Optoelectronic Devices

报 告 人

孙栋 教授

北京大学 物理学院

报告地点

物理楼中楼211

报告时间

2017年9月20日 (星期三) 15:10-18:00

联 系 人

胡小永 (Tel: 62768705)

报告摘要

Ultrafast science & technology is one of the most exciting fields in science and engineering today. In this talk, first I’ll introduce basic aspects about ultrafast spectroscopy and its role towards the development of next generation high performance electronic and optoelectronic devices. Then I’ll describe several representative work regarding ultrafast spectroscopy characterization of two dimensional materials and topological materials that were performed in ICQM by our group during the past few years. These work includes the following: valley polarization dynamics and exciton dynamics of transitional metal dichalcogenides MoS2; anisotropic response of black phosphorus under high electric field and high magnetic field; and photo response of three dimensional Dirac/Weyl semimetals.

 

报告人简介:Dong Sun received his Bachelor degree from University of Science and Technology of China in 2004, and his PhD degree from the University of Michigan in 2009. He was a research fellow at the Center for Ultrafast Optical Science in University of Michigan, USA (2009-2010, 2011-2012) and Research Scientist in University of Washington (2011). From 2012, he was recruited by 2nd Batch of Youth Thousand Talent Program and worked as associated professor at International Center for Quantum Materials (ICQM), Peking University, where he has lead the ultrafast nano-optoelectronics laboratory. His current research interests include using versatile ultrafast spectroscopy tools to study various two dimensional materials and topological materials, targeting at next generation functional device applications.

 

 

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